报告题目: Nano-scale machining with the tip of an AFM probe: research efforts towards an alternative nano-manufacturing process
报告人: Prof./Dr. Emmanuel Brousseau, Cardiff School of Engineering, Cardiff University, United Kingdom
The controlled nano-scale removal of material from the surface of a workpiece conducted with the tip of an Atomic Force Microscope (AFM) probe is a technique which has gained increased attention in the past decade within the micro- and nano-manufacturing research community. The attractive characteristics of this process are that it is relatively simple to implement and it is low-cost compared with vacuum-based lithography techniques for micro- and nano-fabrication. This presentation will provide an overview of a number of research investigations conducted at Cardiff University (UK) in the field of AFM probe-based machining in the past 10 years. The reported work will include a range of experimental and theoretical studies and will also cover recent results from a specific application of the process in the field of nano-magnetism.